A novel automated approach to serial block face dualbeam electron microscopy for the exploration of cortical circuits

Knott, Graham W., Mulders, H., Wall, D. C., Chklovskii, D. B., Reyntjens, S., Lich, B. H. (2006) A novel automated approach to serial block face dualbeam electron microscopy for the exploration of cortical circuits. Microscopy and Microanalysis, 12 (SUPPL.). pp. 1236-1237. ISSN 14319276

URL: http://journals.cambridge.org/action/displayAbstra...
DOI: 10.1017/S1431927606065275
Item Type: Paper
Additional Information: Meeting Abstract
Subjects: Investigative techniques and equipment
Investigative techniques and equipment > microscopy > electron microscopy
Publication Type > Meeting Abstract
CSHL Authors:
Communities: CSHL labs > Chklovskii lab
Depositing User: CSHL Librarian
Date: 2006
Date Deposited: 13 Dec 2011 15:53
Last Modified: 18 Apr 2018 19:32
URI: http://repository.cshl.edu/id/eprint/22841

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